VIS range spectroradiometer 340 to 820 nm

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VIS range spectroradiometer 340 to 820 nm

  • Vendor:Apogee Instruments Inc.

Availability: Available Item
$3,000.00

Overview

The SS-110 measures a wavelength range of 340 to 820 nm. The spectroradiometer is an easy-to-use, cost-effective, versatile spectral measurement system that can be interfaced to a computer. Typical applications include measurement of spectral output (energy flux density, photon flux density, or illuminance) of different radiation sources (often for plant or human lighting), and reflectance and transmittance measurements of natural and synthetic surfaces and materials (often plant leaves and canopies).


Wavelength Range 340 to 820 nm
Wavelength Measurement Interval 1 nm
Wavelength Resolution 3.0 nm (full-width, half-max)
Wavelength Accuracy ± 0.5 nm
Wavelength Repeatability ± 0.2 nm
Analog to Digital Resolution 14 bit
Signal to Noise Ratio 1500:1 (at maximum signal)
Stray Light ≤ 0.25 % at 590 nm
Dark Noise ≤ 3 counts
Integration Time Range 10 ms to 10 s
Linearity Less than 1 % or 0.5 %
Measurement Sensitivity Greater than 10 % max sensitivity for wavelengths greater than 380 nm
Measurement Repeatability Less than 1.0 % (wavelengths greater than 400 nm)
Directional (Cosine) Response ± 5 % at 75 ˚ zenith angle
Fields of View 180 ˚ (upward-facing), 25 ˚ or 150˚ (downward-facing)
Temperature Response -0.1 ± 0.1 % per C
Irradiance Calibration Uncertainty ± 5 %
Current Draw 190 mA during measurement and when idle (USB)
Power Requirement 1 W (USB)
Interface Cable 5 m PVC jacket with USB (for computer)
Software Apogee Spectrovision (windows compatible, XP and later; Mac compatible, 10.9 and later)
Operating Environment -20 to 70 C, 0 to 100 % relative humidity
Thread Size (for Mounting) 1/4 " - 20
Dimensions 89.3 mm height, 50.8 mm width, 38.1 mm depth
Mass 300 g